New Imaging Technologies (NIT), a subsidiary of the French Defense and Space Infrared image specialist Lynred, has launched Lisaswir, a new high-speed short-wave infrared (SWIR) Line-by-Line ScanMamera suitable for quality inspection of siliconwafers.
The Lisaswir has a resolution of 2048 x 1 pixel with 8 µm pixel pitch, a frame speed of more than 80 kHz full frame and a reading sound of 90th. The spectral response is in the range of 9 μm to 1.7 μm. It is based on an internally supplied indium gallium -arsenide (ingaas) line scan -Aray -sensor.
“This industrial sensor and camera offer a high-definition and high-performance inspection solution for our customers for a price that makes new breakthrough applications possible,” said François Coursaget, general manager of NIT, in a statement.
According to the manufacturer, the speed and sensitivity of the Lisaswir camera is said to be able to optimize overall production -efficiency.
The product has a compact form factor, designed for integration into industrial inspection systems. For example, it is optimized for a standard 1.1 ″ (27.9 mm) optical lens format and it is compatible with the generic camera programming interfaces Genicam and Gencp.
The manufacturer claims low costs per pixel, best-in-class reading noise, ultra-short integration times and a high operational speed.
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